calculate_ict_testpoints
Analyze PCB netlist testability, allocate automated bed-of-nails ICT testpoints, assign probe tip types, and verify fault coverage per IPC-9252 & IPC-2221B.
Instructions
Analyze PCB netlist testability, allocate automated bed-of-nails In-Circuit Test (ICT) testpoints (B.Cu Φ1.0mm), assign probe tip types (crown, spear, serrated), and verify fault coverage percentage per IPC-9252 & IPC-2221B.
Tool call template
Replace each placeholder with a value matching the input schema. Only required parameters are included; add optional parameters as needed.
{
"id": 1,
"jsonrpc": "2.0",
"method": "tools/call",
"params": {
"arguments": {
"connections": "<connections>"
},
"name": "calculate_ict_testpoints"
}
}Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| connections | Yes | Netlist connections list (from synthesize_circuit output). | |
| board_width_mm | No | PCB width in mm (default: 70.0). | |
| board_height_mm | No | PCB height in mm (default: 50.0). | |
| min_probe_pitch_mm | No | Minimum probe center-to-center pitch in mm (default: 2.0). | |
| min_pad_diameter_mm | No | Testpad diameter in mm (default: 1.0). |