get_metric_history
Fetch the most recent N samples of a device metric to generate trend charts and 3D visualizations. Specify device ID, metric, and point count to retrieve time-series data.
Instructions
读取设备某指标的最近 N 个采样值(时序数据,供趋势图 / 3D 可视化使用)。
Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| metric | Yes | ||
| points | No | ||
| device_id | Yes |
Output Schema
| Name | Required | Description | Default |
|---|---|---|---|
No arguments | |||