Report the SCAPS installation in use and how it was found, other installations, run folder and jobs.

List files in a SCAPS data folder: definitions, spectra, absorption, grading, generation and more.

Search the command list of the installed SCAPS version.

layer, defect, interface and IFdefect stand for numbered forms (layer2, defect1); contact stands for contactleft or contactright; marks commands without a value.

Read a .def file: layers, bulk defects, interfaces with band offsets, contacts and realism checks.

Fields use script names and units, so any value can be passed back as a parameter (layers[0].NA -> 'layer1.NA'). Graded layers report their base value.

Change a device and save it as a .def file: parameters, layers, defects, materials and solver settings.

Build a new device from scratch and save it as a .def file.

A layer may name a .material file ('material': 'CIGSe.material'); its properties apply first and explicit keys override them.

Simulate a device: J-V metrics, QE, C-V, C-f and spatial profiles, with analysis and realism checks.

Analysis gives the absorber's Shockley-Queisser limit, QE-integrated Jsc and a Mott-Schottky fit of C-V. Overrides apply to this run only; files stay available through scaps_results and scaps_plot.

Run one SCAPS session over many parameter values and tabulate the J-V metrics of every point.

Covers thickness, doping, defect, band offset, temperature, intensity and bias studies. Every point's files are kept for scaps_results and scaps_plot.

List recent runs, or get, wait for or cancel one. A finished job includes its full result.

Return one table of a result file: J-V, QE, C-V, C-f curves or band, generation and AC profiles.

Render result curves as a PNG image. Requires the optional 'plot' extra.

Run a SCAPS script for workflows beyond the other tools: recorder, curve fitting, math, loops, tandem.

The server prepends quit and error-log settings and 'clear all'. Commands are checked against the installed SCAPS; file names must be bare; system commands are rejected. Results saved with 'save results. name' are collected into the run.

Detailed-balance Jsc, Voc, FF and efficiency limits for given band gaps under a SCAPS spectrum.

Add a SCAPS file someone shared (device .def, .material, .abs, spectrum, measurement...) to the installation.

Definitions and materials are parsed to confirm they are valid, and files they reference but that are missing (absorption, grading, filter) are listed.

Write numeric data as a SCAPS input file with the right format and units.

Use it for measured absorption (alpha or extinction coefficient k), custom spectra, external optical generation profiles, contact filters, grading profiles and measurement files for comparison.

Fit device parameters to measured curves, or optimise efficiency, Voc, Jsc or FF, by bounded Nelder-Mead.

Replaces the GUI-only SCAPS curve fitter and supports several measurements at once (light and dark J-V, QE, C-V). Each simplex step is one SCAPS session per measurement condition; long runs continue as a job past wait_seconds, so poll with scaps_jobs.