get_top_authorities_of_origin

Identify top countries of origin for patents based on keywords or IPC classification. Analyze priority filing sources to understand patent trends and filing distributions across jurisdictions.

Instructions

Returns the top authorities (priority countries) of origin for patents matching the criteria. Analyze main sources of priority filings. Either keywords or IPC classification must be specified.

Input Schema

Name	Required	Description
`apply_end_time`	No	Patent application end year (yyyy format). Filters by application filing date.
`apply_start_time`	No	Patent application start year (yyyy format). Filters by application filing date.
`authority`	No	Patent authority code (e.g., CN, US, EP, JP). Filters by patent office. Use OR for multiple, e.g., "US OR EP".
`ipc`	No	Patent IPC classification code. Used to specify a particular technology field.
`keywords`	No	Keywords to search within patent title and abstract/summary. Supports AND, OR, NOT logic. Example: "mobile phone AND (screen OR battery)"
`lang`	No	Language setting. Default is "en" (English). Choose "cn" (Chinese) or "en".
`public_end_time`	No	Patent publication end year (yyyy format). Filters by publication date.
`public_start_time`	No	Patent publication start year (yyyy format). Filters by publication date.

Input Schema (JSON Schema)

{
  "description": "Requires either 'keywords' or 'ipc' to be specified for a meaningful search. If both are provided, IPC is prioritized by the API.",
  "properties": {
    "apply_end_time": {
      "description": "Patent application end year (yyyy format). Filters by application filing date.",
      "type": "string"
    },
    "apply_start_time": {
      "description": "Patent application start year (yyyy format). Filters by application filing date.",
      "type": "string"
    },
    "authority": {
      "description": "Patent authority code (e.g., CN, US, EP, JP). Filters by patent office. Use OR for multiple, e.g., \"US OR EP\".",
      "type": "string"
    },
    "ipc": {
      "description": "Patent IPC classification code. Used to specify a particular technology field.",
      "type": "string"
    },
    "keywords": {
      "description": "Keywords to search within patent title and abstract/summary. Supports AND, OR, NOT logic. Example: \"mobile phone AND (screen OR battery)\"",
      "type": "string"
    },
    "lang": {
      "description": "Language setting. Default is \"en\" (English). Choose \"cn\" (Chinese) or \"en\".",
      "type": "string"
    },
    "public_end_time": {
      "description": "Patent publication end year (yyyy format). Filters by publication date.",
      "type": "string"
    },
    "public_start_time": {
      "description": "Patent publication start year (yyyy format). Filters by publication date.",
      "type": "string"
    }
  },
  "type": "object"
}

PatSnap MCP Server

get_top_authorities_of_origin

Instructions

Input Schema

Input Schema (JSON Schema)

Other Tools from PatSnap MCP Server

Related Tools

MCP directory API