attest_inspect_sample
Probabilistic secondary inspection of a record batch (C20: hive-secondary-inspection). Returns a signed inspection record. Reference-grade implementation. Wire format normative; production-grade is Layer B.
Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| seed | No | Optional RNG seed for reproducibility | |
| records | Yes | Records to probabilistically inspect | |
| sample_id | Yes | Identifier for the sample batch | |
| sample_rate | No | Fraction to inspect (0.0 to 1.0) |