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667,482 tools. Updated 2026-10-17 01:25

"Mitsubishi" matching MCP tools:

  • Actively fingerprint OT endpoints to build an asset register with vendor, model, firmware, serial, and reachability status.
    MIT
  • Actively connects to industrial endpoints over OT protocols to read device identity (vendor, model, firmware, serial) and build an asset register with reachability status.
    MIT
  • Monitor only value changes in OT points: polls a reference, applies deadband, and returns timestamped changes with hard limits, across OPC-UA, Modbus, S7, and more.
    MIT
  • Capture only value changes for an industrial data point over a bounded window, returning timestamps and previous values to identify significant shifts while avoiding sample flooding.
    MIT
  • Retrieve CC-Link refresh-image templates mapping RX/RY/RWr/RWw to PLC devices via a Mitsubishi master PLC. Use these defaults to identify data routes for CC-Link and CC-Link IE networks.
    MIT

Matching MCP Servers

  • F
    license
    A
    quality
    A
    maintenance
    Provides read-only analysis of Mitsubishi GX Works3 PLC projects via MCP, enabling device tracing, cross-referencing, ladder inspection, linting, and report generation without modifying source projects.
    4
    15
    62 PyPI
    8
    -
  • F
    license
    A
    quality
    C
    maintenance
    Lets AI agents and users analyze Mitsubishi MELSEC .gx3 projects directly, tracing coil conditions, checking device references, comparing program changes, and inspecting ladder logic without opening GX Works3.
    13
    4
    -
  • Discover which industrial protocols and analytics are available, their status, read/write tools, and connection parameters, including no-egress mode, before selecting a tool.
    MIT
  • Retrieve MELSEC CPU type and code from an MC endpoint to verify live link and confirm Mitsubishi PLC connectivity.
    MIT
  • Batch-read multiple data words from Mitsubishi PLCs over one FINS session by specifying area, address, and count per item. Returns word arrays for monitoring and diagnostics.
    MIT