wpf_snapshot
Capture a subtree snapshot of layout, visibility, alignment, brushes, and text, then compare it with another snapshot to detect changes.
Instructions
Capture a snapshot of an element's subtree (layout metrics, visibility, alignment, brushes, text) and store it under a label, to diff later with wpf_diff. Workflow: wpf_snapshot(label='before') → make a change (e.g. wpf_set_property) → wpf_snapshot(label='after') → wpf_diff('before','after') to see exactly what moved. element_handle sets the subtree root (omit for the whole main window); max_depth default 25. Returns the label and how many elements were captured.
Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| label | No | ||
| max_depth | No | ||
| element_handle | No |