inspect_artifact
Summarize an artifact's shape, axes, extent, sample rate, NaN fraction, parametric axis/unit, and provenance using a full ID or unique prefix.
Instructions
Summarise an artifact (parametric axis and unit, shape, axes, extent, sample rate, NaN fraction) and how it was produced. Accepts a full id or a unique prefix.
Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| artifact_id | Yes |
Output Schema
| Name | Required | Description | Default |
|---|---|---|---|
No arguments | |||