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Alternatives to wafer-map-mcp

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    Related Servers

    • A
      license
      Not graded
      quality
      D
      maintenance
      Enables LLMs to access, analyze, and extract information from STDF-V4 semiconductor test data files, supporting metadata extraction, parametric analysis, yield calculations, and multi-site test data filtering with CSV/Excel export capabilities.
      2
      MIT
    • A
      license
      Not graded
      quality
      D
      maintenance
      Enables AI agents to perform statistical process control calculations using validated, deterministic tools such as control charts, capability analysis, and tolerance intervals.
      3
      MIT
    • A
      license
      A
      quality
      D
      maintenance
      Provides machine learning researchers with tools for creating publication-quality scientific visualizations, statistical plots, and 2D data representations. It streamlines the research workflow by enabling AI assistants to generate complex figures from CSV, JSON, or direct data inputs.
      8
      9
      MIT
    • F
      license
      Not graded
      quality
      C
      maintenance
      Enables AI assistants to analyze plant-floor data using OEE, Pareto, SPC, and yield-loss calculations, providing continuous-improvement insights from manufacturing data.
      1
      -
    • A
      license
      A
      quality
      C
      maintenance
      Enables AI agents to create data visualizations like bar charts, line charts, pie charts, scatter plots, and histograms, returning inline SVG or PNG files.
      5
      MIT
    • A
      license
      A
      quality
      A
      maintenance
      Enables AI agents to perform reproducible, verifiable statistical analysis through 25 deterministic tools for descriptive statistics, hypothesis testing, regression, clustering, time-series forecasting, and Chinese-labeled plotting.
      30
      1
      MIT