Metadata-Version: 2.4
Name: stdf-mcp
Version: 0.1.0
Summary: MCP Server for STDF-V4 Package Test File Access
Author: STDF MCP Development Team
License: MIT
Project-URL: Homepage, https://github.com/stdf-mcp/stdf-mcp
Project-URL: Repository, https://github.com/stdf-mcp/stdf-mcp.git
Project-URL: Issues, https://github.com/stdf-mcp/stdf-mcp/issues
Keywords: mcp,stdf,semiconductor,testing,package-test
Classifier: Development Status :: 3 - Alpha
Classifier: Intended Audience :: Developers
Classifier: Topic :: Software Development :: Libraries :: Python Modules
Classifier: Topic :: Scientific/Engineering :: Electronic Design Automation (EDA)
Classifier: License :: OSI Approved :: MIT License
Classifier: Programming Language :: Python :: 3
Classifier: Programming Language :: Python :: 3.11
Classifier: Programming Language :: Python :: 3.12
Requires-Python: >=3.11
Description-Content-Type: text/markdown
Requires-Dist: mcp>=1.0.0
Requires-Dist: numpy>=1.24.0
Requires-Dist: matplotlib>=3.6.0
Provides-Extra: dev
Requires-Dist: pytest>=7.0.0; extra == "dev"
Requires-Dist: pytest-cov>=4.0.0; extra == "dev"
Requires-Dist: pytest-asyncio>=0.21.0; extra == "dev"
Requires-Dist: black>=23.0.0; extra == "dev"
Requires-Dist: flake8>=6.0.0; extra == "dev"
Requires-Dist: mypy>=1.0.0; extra == "dev"
Requires-Dist: types-setuptools; extra == "dev"
# STDF-V4 MCP Server
A Model Context Protocol (MCP) server that enables LLMs to efficiently access, analyze, and extract information from STDF-V4 files containing package/final test data used in semiconductor testing.
## Features
- **6 Specialized Metadata Tools**: Extract file overview, test configuration, yield summary, facility details, program metadata, and test parameters
- **4 Analysis Tools**: Filtered data extraction, statistical analysis, visualization, and CSV export
- **STDF-V4 Package Test Focus**: Exclusively supports STDF-V4 format with package/final test data
- **High Performance**: Handles files up to 2GB with <512MB memory usage through streaming parser
- **Automatic Integrity Validation**: Built-in file validation during all operations
- **TDD Development**: Comprehensive test coverage with TestCases integration
## Architecture
### 10-Tool MCP Architecture
**Metadata Tools (6):**
- `extract_file_overview` - Quick file assessment and key identifiers
- `extract_test_configuration` - Hardware setup and test environment
- `extract_yield_summary` - Test results analysis and yield calculation
- `extract_facility_details` - Manufacturing context and facility information
- `extract_program_metadata` - Test program and software version details
- `extract_test_parameters` - Comprehensive parameter listing with limits
**Analysis Tools (4):**
- `extract_filtered_data` - Multi-parameter extraction with CSV output
- `calculate_statistics` - Multi-site statistical analysis with comparisons
- `generate_visualization` - Charts and plots for test parameters
- `export_csv` - Complete DUT test results export
## Requirements
- Python 3.11+
- Anthropic MCP SDK
- numpy (statistical calculations)
- matplotlib (visualization)
## Installation
```bash
pip install -e .
```
## Development
```bash
# Install with development dependencies
pip install -e ".[dev]"
# Run tests
pytest
# Run with coverage
pytest --cov=src/stdf_mcp --cov-report=html
# Format code
black src/ tests/
# Type checking
mypy src/
# Linting
flake8 src/ tests/
```
## Testing
The project uses comprehensive TDD approach with:
- **Unit Tests**: Core STDF-V4 parsing and data models
- **Integration Tests**: End-to-end MCP server workflows
- **Contract Tests**: MCP tool API compliance
- **TestCases Integration**: Real STDF-V4 files from `TestCases/` directory
- **Output Standards**: Results stored in `TestCases/Output/` with naming convention
## Performance Targets
- Metadata extraction: <5 seconds
- Filtered data extraction: <30 seconds for 1GB files
- Memory usage: <512MB for 1GB files
- Concurrent support: 10 LLM instances with queuing
## Scope
**Supported:**
- STDF-V4 format exclusively
- Package/final test data only
- Files up to 2GB
- Streaming/chunked processing
**Not Supported:**
- STDF-V3 files (rejected with clear error)
- Wafer test data (rejected with clear error)
- Data retention between sessions
- Authentication/authorization
## License
MIT License