Retrieve citation counts for IEEE papers and patents by providing article numbers or DOIs, enabling researchers to assess academic impact through the IEEE Xplore MCP Server.
101,503 tools. Last updated 2026-04-11 14:15
- Search IEEE standards and specifications by query, type, or committee to find technical requirements for projects and research.MIT
- Find IEEE conferences by topic, year, location, or result count to discover relevant academic events and proceedings for research planning.MIT
- Search for academic papers within specific IEEE journals or conferences using publication name, year range, and additional keywords to find relevant research.
- Retrieve comprehensive metadata for IEEE papers using article numbers or DOIs, including author affiliations, abstracts, keywords, citation counts, and access URLs.
- Find academic papers by a specific author in IEEE Xplore. Filter results by year range, content type, publication title, and manage pagination for comprehensive research.
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