"author:darrellathaya" matching MCP servers:

• manufacturing-defect-mcp

  darrellathaya

  F

  license

  -

  quality

  C

  maintenance

  MCP server for manufacturing defect investigation using knowledge graphs and graph analytics. Enables LLM agents to retrieve context, find similar cases, and generate investigation reports from manufacturing data.

  Updated 2 months ago (2026-06-23 16:53 UTC)