US Semiconductor Fab Utilization Tightness
adw.adw_388Returns a 0-100 US semiconductor fab-utilization tightness score (capacity strain plus single-region dependency risk, with export-control enforcement inputs; history to 1976) with tightness_score, capacity_strain, single_region_dependency, confidence, and methodology_version. Call when the user asks about chip supply tightness, fab capacity, or export-control exposure to chip lead times, or when timing procurement buffers, lead-time commitments, or second-source qualification. Updates: monthly.
Input Schema
| Name | Required | Description | Default |
|---|---|---|---|
| days | No | Optional: return a daily HISTORY series of the last N days (up to 5 years of real archived data) instead of the current snapshot. History requires Gold tier; without it, the current snapshot is returned. |